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Periodical issue Periodical issue WorldCat catalogue WorldCat
Title:HIV/AIDS and the world of work
Editors:Sprague, CourtenayISNI
Dickinson, DavidISNI
Year:2008
Periodical:African Journal of AIDS Research (ISSN 1608-5906)
Volume:7
Issue:3
Pages:388
Language:English
Geographic term:South Africa
Subjects:AIDS
labour force
work environment
occupational health
conference papers (form)
2008
External link:https://www.tandfonline.com/toc/raar20/7/3
Abstract:Unlike other diseases, HIV/AIDS affects the labour force. Concentrating on South Africa-based companies and organizations, this special issue of AJAR uses a qualitative methodological research approach, rooted in the social sciences, to gather and analyse workplace-related HIV/AIDS data and trends. The authors comprise a subset of the group of 30 individuals who presented research at the 2nd Wits HIV/AIDS in the Workplace Research Symposium, at the University of the Witwatersrand, in Johannesburg, South Africa, on 29 and 30 May 2008. They discuss issues such as school managers' understanding of HIV/AIDS; wellness programme and health policy at a faith-based organization; perspectives from a mining-sector workplace; traditional healers, HIV/AIDS and company programmes; workplace peer educators and stress; HIV epidemiology in a manufacturing company; data protection standards and confidentiality of HIV/AIDS status in the workplace; sex work, reform initiatives and HIV/AIDS in inner-city Johannesburg; employees' perceptions of the Aid-for-AIDS disease management programme; women's health, HIV/AIDS and the workplace; HIV/AIDS treatment guidelines for women of reproductive age; migration, access to antiretroviral treatment (ART) and survivalist livelihood strategies in Johannesburg; use and neglect of best-practice HIV/AIDS programme guides by South African companies. Contributors: O. Akintola, U. Amadi-Ihunwo, E.D. Arend, A. Bhagwanjee, D. Dickinson, C. Evian, G. George, K.D. Kgatea, T. Murray., Z. Muskat-Gorska, I. Petersen, M. Richter, A. Rothberg, C. Sprague, M. Stevens, K. Van Huyssteen, J. Vearey and R. Whelan. [ASC Leiden abstract]

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